Almost all manufacturers have adopted the Mie correction method in the laser particle analyzers put on the market in recent years, that is, in the large particle size range, the 琅 and Fei diffraction principles are applied, and in the small particle size range, the classic Mie scattering theory, thereby improving the measurement accuracy in a small particle size range under the condition of maintaining measurement accuracy in a large particle size range.

 

The laser particle analyzer based on Mie scattering theory is rapidly developed along with the advancement and development of science and technology and production process, especially with the development and application of computer technology. Raymond mill price was early because The computational technology is relatively underdeveloped, the Mie scattering theory is complicated, the calculation is cumbersome, and the computer has not been popularized, so the Mie scattering theory is difficult to play a big role.

 

There are many microscopes for measuring the particle size of the dryer, such as optical microscope, transmission electron microscope, scanning electron microscope, etc., which can directly observe and measure the particle size characteristics of individual particles, and compare the sensitivity of the shape and particle size composition of the particles. The method is much better, often used to calibrate other methods, or to help analyze errors generated by several other measurement methods.

 

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